Optics: measuring and testing – Sample – specimen – or standard holder or support
Patent
1999-03-26
2000-10-03
Font, Frank G.
Optics: measuring and testing
Sample, specimen, or standard holder or support
356440, 356300, 2503418, 250340, 2503411, G01N 2101, G01J 502
Patent
active
061280755
ABSTRACT:
A stage for an infrared spectroscope has a focusing body and a sampling element spaced apart by a mounting fixture. The focusing body and sampling element optically cooperate by transmission and internal refraction and reflection to focus an infrared beam on a sample surface and to collect the beam for analysis after it was reflected from the sample surface. The sampling element is made of a durable material and can be removably mounted in the fixture.
REFERENCES:
patent: 5046854 (1991-09-01), Weller et al.
patent: 5093580 (1992-03-01), Sting
patent: 5172182 (1992-12-01), Sting et al.
patent: 5200609 (1993-04-01), Sting et al.
patent: 5210418 (1993-05-01), Harrick et al.
patent: 5552604 (1996-09-01), Sting et al.
patent: 5616922 (1997-04-01), Reffner et al.
patent: 5703366 (1997-12-01), Sting et al.
Applicant's Exhibit A, "DuraSampllR" four-page color brochure of Applied Systems, Inc., Norwalk, CT, 1996, admitted prior art.
Applicant's Exhibit B, "Single Bounce HATR Accessory" two-page brochure of Spectra-Tech, Inc., Shelton, CT, 1996, admitted prior art.
Applicant's Exhibit C, "Thunderdome" two-page brochure of Spectra-Tech, Inc., Shelton, CT, undated, admitted prior art.
Applicant's Exhibit D, "The Split Pea Accessory", three-page brochure of Harrick Scientific, undated, admitted prior art.
Applicant's Exhibit E, "Golden Gate Single Reflection Diamond ATR", two-page brochure of Specac Ltd., undated, admitted prior art.
A dual beam total internal reflection fluorescence spectrometer for dynamic depth resolved measurements of biochemical liquid solid interface binding reactions in opaque solvents. L.W. Liebmann, J.A. Robinson and K.G. Mann; Rev. Sc. Instrum. 62(9), Sep. 1991, pp. 2083-2092.
Micro-optic system for reflectance measurements at pressures to 70 kilobar. B. Welber, Rev. Sci. Instrum. 48(4), Apr. 1977, pp. 395-395.
Microoptic double beam system for reflectance and absorption measurements at high pressure. K. Syassen, R. Sonnenschein, Rev. Sci. Instrum. 53(5), May 1982, pp. 644-650.
Internal Reflectance Spectroscopy by N. J. Harrick, pp. 89-145.
Font Frank G.
Pike Technologies of Wisconsin, Inc.
Punnoose Roy M.
LandOfFree
Diamond anvil spectroscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Diamond anvil spectroscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Diamond anvil spectroscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-201007