Diagnostics in process control and monitoring systems

Details Diagnostics in process control and monitoring systems Diagnostics in process control and monitoring systems

2006-05-16

2011-10-04

Decady, Albert (Department: 2121)

Data processing: generic control systems or specific application

Generic control system, apparatus or process

Sequential or selective

C700S012000, C700S014000, C700S110000, C073S037000, C073S053040, C073S054110, C073S054130, C073S054140, C073S861000, C340S457400, C340S500000, C702S127000, C702S128000, C702S176000, C702S178000, C702S180000, C702S186000

Reexamination Certificate

active

08032234

ABSTRACT:
A condition of an industrial process is diagnosed based upon process variable information related to a value of a measured process variable. Histogram information is calculated based upon the determined process variable information and time information related to a duration of time the measured process variable has the value. Condition of the industrial process is diagnosed based upon the calculated histogram information.

REFERENCES:
patent: 5665899 (1997-09-01), Willcox
patent: 5710723 (1998-01-01), Hoth et al.
patent: 5746511 (1998-05-01), Eryurek et al.
patent: 5828567 (1998-10-01), Eryurek et al.
patent: 5838561 (1998-11-01), Owen
patent: 5905648 (1999-05-01), Badami
patent: 5941918 (1999-08-01), Blosser
patent: 5956663 (1999-09-01), Eryurek
patent: 5973963 (1999-10-01), Sugawara
patent: 6017143 (2000-01-01), Eryurek et al.
patent: 6047220 (2000-04-01), Eryurek
patent: 6119047 (2000-09-01), Eryurek et al.
patent: 6141629 (2000-10-01), Yamamoto et al.
patent: 6339737 (2002-01-01), Yoshimura et al.
patent: 6356191 (2002-03-01), Kirkpatrick et al.
patent: 6370448 (2002-04-01), Eryurek
patent: 6397114 (2002-05-01), Eryurek et al.
patent: 6427102 (2002-07-01), Ding
patent: 6434504 (2002-08-01), Eryurek et al.
patent: 6449574 (2002-09-01), Eryurek et al.
patent: 6472710 (2002-10-01), Terashima
patent: 6505517 (2003-01-01), Eryurek et al.
patent: 6519546 (2003-02-01), Eryurek et al.
patent: 6532392 (2003-03-01), Eryurek et al.
patent: 6539267 (2003-03-01), Eryurek et al.
patent: 6556145 (2003-04-01), Kirkpatrick et al.
patent: 6594603 (2003-07-01), Eryurek et al.
patent: 6601005 (2003-07-01), Eryurek et al.
patent: 6611775 (2003-08-01), Coursolle et al.
patent: 6615149 (2003-09-01), Wehrs
patent: 6629059 (2003-09-01), Borgeson et al.
patent: 6654697 (2003-11-01), Eryurek et al.
patent: 6701274 (2004-03-01), Eryurek et al.
patent: 6754601 (2004-06-01), Eryurek et al.
patent: 6772036 (2004-08-01), Eryurek et al.
patent: 6832175 (2004-12-01), Adachi et al.
patent: 6859755 (2005-02-01), Eryurek et al.
patent: 6889166 (2005-05-01), Zielinski et al.
patent: 6907383 (2005-06-01), Eryurek et al.
patent: 6912484 (2005-06-01), Bibelhausen et al.
patent: 6970003 (2005-11-01), Rome et al.
patent: 7010459 (2006-03-01), Eryurek et al.
patent: 7018800 (2006-03-01), Huisenga et al.
patent: 7046180 (2006-05-01), Jongsma et al.
patent: 7058542 (2006-06-01), Hauhia et al.
patent: 7260487 (2007-08-01), Brey et al.
patent: 7659813 (2010-02-01), Chambers et al.
patent: 7702699 (2010-04-01), Vazquez et al.
patent: 7706938 (2010-04-01), Palladino
patent: 7715930 (2010-05-01), Bush et al.
patent: 7953501 (2011-05-01), Zielinski et al.
patent: 2002/0013639 (2002-01-01), Fujishima et al.
patent: 2003/0144746 (2003-07-01), Hsiung et al.
patent: 2004/0072239 (2004-04-01), Renaud et al.
patent: 2004/0205182 (2004-10-01), Geddes
patent: 2004/0249583 (2004-12-01), Eryurek et al.
patent: 2005/0011278 (2005-01-01), Brown et al.
patent: 2005/0132808 (2005-06-01), Brown et al.
patent: 2005/0240377 (2005-10-01), Bibelhausen et al.
patent: 2006/0095394 (2006-05-01), Miller et al.
patent: 2006/0106469 (2006-05-01), Huang et al.
patent: 2006/0260697 (2006-11-01), Lochtefeld et al.
patent: 2007/0198215 (2007-08-01), Bonanni et al.
patent: 2008/0004841 (2008-01-01), Nakamura
patent: 2008/0052038 (2008-02-01), Popivanov
patent: 1345182 (2003-09-01), None
patent: 1345182 (2003-10-01), None
patent: WO 2005059476 (2005-06-01), None
U.S. Appl. No. 09/972,078, filed Oct. 5, 2001; titled “Root Cause Diagnostics”.
U.S. Appl. No. 11/238,674, filed Sep. 29, 2005; titled “Leak Detector for Process Valve”.
“Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration” for PCT/US2007/010915 filed May 4, 2007; 14 pages.
Official Communication from corresponding European Application No. EP 07794575.6, dated Mar. 31, 2009.
“Summons to Attend Oral Proceedings pursuant to Rule 115(1) EPC” from corresponding European Application No. EP 07794575.6, dated Apr. 6, 2010.
First Office Action from related Chinese Application No. 200780017797.4, dated Aug. 4, 2010.

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