Diagnostic tool and method for locating the origin of parasitic

Details Diagnostic tool and method for locating the origin of parasitic Diagnostic tool and method for locating the origin of parasitic

1991-03-08

1995-02-21

Beausoliel, Jr., Robert W.

Excavating

371 211, G11C 2900

Patent

active

053922948

ABSTRACT:
A technique is disclosed for distinguishing parasitic cell failures from other type failures of cells in a memory array. A parasitic failure is defined as one action between cells "k" and "j" such that writing into cell "j" causes a change in cell "k" without intentionally writing into cell "k."
A binary pattern generator, produces array test patterns equivalent to a Hamming single error correction code. Each of the patterns is associated with a syndrome bit position and is used to test each array address in turn. Each pattern is read back out by array address and the results are stored in a separate memory for storing the failing syndromes for each failing cell array address. For each cell failure, the syndrome bits form an "address" which is exclusive ORed with the address of the failed cell to yield the address of the root cell causing coupling (parasitic) failure of the failed cell.

REFERENCES:
patent: 3714403 (1973-01-01), Ammann et al.
patent: 4005405 (1977-01-01), West
patent: 4277844 (1981-07-01), Hancock et al.
patent: 4388684 (1983-06-01), Nibby, Jr. et al.
patent: 4417339 (1983-11-01), Cantarella
patent: 4559626 (1985-12-01), Brown
patent: 4562576 (1985-12-01), Ratcliffe
patent: 4646312 (1987-02-01), Goldsbury et al.
patent: 4648091 (1987-03-01), Gajjar
patent: 4667330 (1987-05-01), Kumagai
patent: 4723245 (1988-02-01), Leslie
patent: 4739504 (1988-04-01), Leslie
patent: 4739505 (1988-04-01), Leslie
patent: 4739506 (1988-04-01), Leslie
patent: 4744086 (1988-05-01), Komly et al.
patent: 4989210 (1991-01-01), Scheuneman et al.
patent: 5062109 (1991-10-01), Ohshima et al.
patent: 5170398 (1992-12-01), Fujieda et al.
"Embedded Array Self-Test Simulator" IBM Technical Disclosure Bulletin, vol. 31, No. 8 Jan. 1989 pp. 171-174.
IBM Technical Disclosure Bulletin, vol. 23, No. 1, p. 203, Jun. 1980, H. J. Hollands et al., "Memory Tester Using Random Addresses And Random Data".

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