Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-12-11
2007-12-11
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S035000, C702S081000, C702S182000, C702S185000, C702S184000, C702S188000, C700S108000, C700S110000, C700S109000
Reexamination Certificate
active
11203853
ABSTRACT:
A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.
REFERENCES:
patent: 5005142 (1991-04-01), Lipchak et al.
patent: 5465321 (1995-11-01), Smyth
patent: 5496450 (1996-03-01), Blumenthal et al.
patent: 5566092 (1996-10-01), Wang et al.
patent: 5754965 (1998-05-01), Hagenbuch
patent: 5995916 (1999-11-01), Nixon et al.
patent: 6014598 (2000-01-01), Duyar et al.
patent: 6278962 (2001-08-01), Klimasauskas et al.
patent: 6393373 (2002-05-01), Duyar et al.
patent: 6480810 (2002-11-01), Cardella et al.
patent: 6519552 (2003-02-01), Sampath et al.
patent: 6526356 (2003-02-01), DiMaggio et al.
patent: 6532426 (2003-03-01), Hooks et al.
patent: 6556939 (2003-04-01), Wegerich
patent: 6590362 (2003-07-01), Parlos et al.
patent: 6609036 (2003-08-01), Bickford
patent: 6625569 (2003-09-01), James et al.
patent: 6687654 (2004-02-01), Smith, Jr. et al.
patent: 6853920 (2005-02-01), Hsiung et al.
patent: 6898554 (2005-05-01), Jaw et al.
patent: 6975962 (2005-12-01), Wegerich et al.
patent: 2002/0055826 (2002-05-01), Wegerich et al.
patent: 2002/0152056 (2002-10-01), Herzog et al.
Pipke R. Matthew
Wegerich Stephan W.
Wolosewicz Andre
Fitch Even Tabin & Flannery
Tsai Carol S. W.
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