Diagnostic systems and methods

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Details

C702S115000, C702S127000, C702S182000, C702S185000

Reexamination Certificate

active

08055475

ABSTRACT:
The present invention relates to systems and methods for diagnosing undesirable events or the lack of desirable events representing product or process malfunctions. One aspect of the invention includes a method for determining a cause of a malfunction event in a prototype or production product or process. Another aspect of the invention includes a method for identifying evidence of deviation from a specification for a product or process. Still another aspect of the invention includes a method for ascertaining the reliability of a product or process. The present invention also provides a diagnostic computer system and computer program code for performing various methods embodying different aspects of the present invention. A computer system for training a user to diagnose and apply corrective action to a malfunctioning product or process is also provided.

REFERENCES:
patent: 5557557 (1996-09-01), Frantz et al.
patent: 2003/0147351 (2003-08-01), Greenlee
patent: 2007/0168174 (2007-07-01), Davari et al.
Kaufman, Jerry J., Functional Analysis System Technique (FAST) Value Engineering for The Practioner, North Carolina Statu University, U.S., 3rd Ed. 1990, pp. 3-1 to 3-23.

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