Diagnostic system for integrated circuits using existing pads

Details Diagnostic system for integrated circuits using existing pads Diagnostic system for integrated circuits using existing pads

1990-02-13

1991-07-09

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 225, G01R 3128

Patent

active

050309048

ABSTRACT:
Circuit points in an integrated circuit (IC) are monitored at pads normally used to carry information between ports of a normal source on the IC (such as input/output points of a cache control), and a memory unit off the IC. The pads are time-shared between their normal and monitoring functions. Each pad is shared by a port of the normal source (the cache control) and a pair of alternative sources to be monitored. During times when the alternative sources are accessed through a pad, they are connected to it alternately, so that, on a first level, each pad is shared between a normal source and a pair of alternative sources, and, on a second level, each such pad is shared between the two alternative sources when they are being accessed.

REFERENCES:
patent: 4336495 (1982-06-01), Hapke
patent: 4398146 (1983-08-01), Draheim et al.
patent: 4635261 (1987-01-01), Anderson et al.
patent: 4714876 (1987-12-01), Gay et al.
patent: 4724380 (1988-02-01), Burrows et al.
patent: 4743841 (1988-05-01), Takeuchi

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