Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-03-25
1998-09-22
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324548, 324519, 340436, G01R 3112
Patent
active
058119787
ABSTRACT:
A diagnostic circuit for checking a capacity of a backup condenser having a check circuit in which the clamp means includes a Zener diode and a transistor connected in parallel with the backup condenser and the current flowing through a charge resistor, the Zener diode and the transistor during a time B that the transistor is turned on by a microprocessor, results in the terminal voltage of the backup condenser to be clamped to a predetermined clamp voltage.
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Regan Maura K.
Toyota Jidosha & Kabushiki Kaisha
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