Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-14
2007-08-14
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
11272359
ABSTRACT:
In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.
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Hightower Robert F.
Patel Paresh
Semiconductor Components Industries L.L.C.
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