Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-09-25
2009-10-20
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S185000
Reexamination Certificate
active
07606679
ABSTRACT:
According to some embodiments, a light emitting diode (LED) power management and diagnostics history recording integrated circuit includes a power management circuit controlling a supply of power to the LED, a diagnostics detection circuit recording a diagnostics history for the LED, a non-volatile diagnostics history memory storing the diagnostics history; and an external interface for transferring externally the diagnostics history stored in the non-volatile diagnostics history memory. The diagnostics history includes diagnostics data for at least two sequential occurrences of a reoccurring fault condition. The diagnostics data may include temperature, under-voltage, over-voltage, open-circuit load, and short-circuit load indicators, among others. A diagnostics analysis system downloads the diagnostics data after a given operation period and performs maintenance decisions according to the diagnostics data. Such systems are particularly useful for diagnosing intermittent faults and/or faults in remotely-located systems, and making maintenance decisions accordingly.
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Gagea Leonard
Russell Anthony
Voicu Gelu
Bui Bryan
Law Office of Andrei D. Popovici, PC
Semiconductor Components Industries L.L.C.
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