Devices, systems, and methods for analyzing snow stability

Details Devices, systems, and methods for analyzing snow stability Devices, systems, and methods for analyzing snow stability

2005-10-25

2005-10-25

Garber, Charles (Department: 2856)

Measuring and testing

Testing of material

Reexamination Certificate

active

06957593

ABSTRACT:
Devices, systems, and methods are disclosed for analyzing various characteristics of snow. In one embodiment of the present invention, a snow sensor is attached to a probe that is inserted beneath the surface of the snow. A depth sensor is provided that measures the depth of the snow sensor as it is operated. The invention can record at least one characteristic of snow as a function of depth.

REFERENCES:
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patent: 5831161 (1998-11-01), Johnson et al.
patent: 5864059 (1999-01-01), Sturm et al.
patent: 6530284 (2003-03-01), Tambo et al.
patent: 11211846 (1999-08-01), None
patent: 2000081314 (2000-03-01), None

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