Devices for measuring the optical absorption in thin layer mater

Details Devices for measuring the optical absorption in thin layer mater Devices for measuring the optical absorption in thin layer mater

1992-08-04

1993-12-07

Rosenberger, Richard A.

Optics: measuring and testing

For light transmission or absorption

356128, G01N 2100

Patent

active

052687465

ABSTRACT:
A device measuring the optical absorption in thin layer materials by using the photothermal deflection spectroscopy (P.D.S.) comprises a laser source, an optical doubler between the laser source and the probe intended to divide the laser beam in two equal, parallel measurement and control beams, a cylindrical lens between the doubler and the probe, and a pair of position sensors which receive the beams focused by said lens and send them to an electronic circuit supplying a signal output which is not influenced by the noise due to the instability in the direction of the analyzer beam and to the mechanical vibrations.

REFERENCES:
patent: 4562350 (1985-12-01), Tirouard et al.
patent: 4589783 (1986-05-01), Thomas et al.
patent: 4813763 (1989-03-01), Saito et al.
patent: 4830502 (1989-05-01), Saito et al.

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