Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate
2007-02-06
2007-02-06
Porta, David (Department: 2884)
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
C378S098800
Reexamination Certificate
active
10433799
ABSTRACT:
There is disclosed a device for imaging radionuclide emissions comprising: a charge coupled device or CMOS active pixel sensor device; and a scintillator layer in direct contact with the charge coupled device or CMOS active pixel sensor device; in which the thickness of the scintillator layer is greater than 200 μm, preferably greater than 400 μm, most preferably about 500 μm.
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Karellas, et al., “Imaging of Radionuclide Emissions with a Low-noise Charge-Coupled Device,”IEEE, Transactions on Nuclear Science, vol. 40, No. 4, Aug. 1993, pp. 979-982.
Fraser George William
Lees John Ernest Wyper
Ott Robert John
Boosalis Faye
Fredrikson & Byron , P.A.
Porta David
University of Leicester
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