Devices and methods for testing clock and data recovery devices

Details Devices and methods for testing clock and data recovery devices Devices and methods for testing clock and data recovery devices

2008-05-20

2008-05-20

Barlow, Jr., John E (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Reexamination Certificate

active

07376528

ABSTRACT:
When used as a test data generator, CDR internal structures may be applied to generate drift conditions in the test data. For example, a finite state machine phase shifts a clock signal, over time, driving the test data generator thereby producing a drift condition on the test data. Once the test is completed, one of the other CDRs may be used as a tester to similarly generate test data for the first CDR. CDRs may be configured in pairs for this purpose so that one may be used to test the other.

REFERENCES:
patent: 4456890 (1984-06-01), Carickhoff
patent: 2002/0090045 (2002-07-01), Hendrickson
patent: 2003/0164724 (2003-09-01), Momtaz et al.
patent: 2005/0047495 (2005-03-01), Yoshioka
patent: 2005/0069071 (2005-03-01), Kim et al.
patent: 2005/0220240 (2005-10-01), Lesso
patent: 2008/0031385 (2008-02-01), Aung et al.

Affiliated with

Also associated with

Rating

Devices and methods for testing clock and data recovery devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Devices and methods for testing clock and data recovery devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Devices and methods for testing clock and data recovery devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2794808