Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Reexamination Certificate
2007-07-24
2007-07-24
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
C356S330000
Reexamination Certificate
active
11243054
ABSTRACT:
A spectral measurement device comprising an entrance aperture for receiving an electromagnetic energy and a mask located at the entrance aperture in the form of a two-dimensional encodement pattern. An optical element conditions the electromagnetic energy received from the mask for presentation to the spectral dispersion element and the and a spectral dispersion element disperses the electromagnetic energy in one or more dimensions. Additionally, the optical element conditions the dispersed electromagnetic energy onto an array of detector elements.
REFERENCES:
patent: 4193691 (1980-03-01), Fjarlie
patent: 4448529 (1984-05-01), Krause
patent: 4790654 (1988-12-01), Clarke
patent: 5061049 (1991-10-01), Hornbeck
patent: 5323002 (1994-06-01), Sampsell et al.
patent: 5384725 (1995-01-01), Coifman et al.
patent: 5483335 (1996-01-01), Tobias
patent: 5504575 (1996-04-01), Stafford
patent: 5506676 (1996-04-01), Hendler et al.
patent: 5526299 (1996-06-01), Coifman et al.
patent: 5627639 (1997-05-01), Mende et al.
patent: 5737075 (1998-04-01), Koch et al.
patent: 5748308 (1998-05-01), Lindberg et al.
patent: 5828066 (1998-10-01), Messerschmidt
patent: 7092101 (2006-08-01), Brady et al.
Coifman et al., “Entropy-Based Algorithms for Best Basis Selection,” IEEE Transactions on Information Theory, vol. 38, No. 2, 713-718, Mar. 1992.
Mende et al., Hadamard spectroscopy with a two-dimensional detecting array, Applied Optics, Voc. 32, No. 34, 7095-7105, Dec. 1, 1993.
Thiele, “A Fast Algorithm for Adapted Time-Frequency Tilings,” Applied and Computational Harmonic Analysis, 3, 91-99 (1996).
Coifman Ronald R.
Coppi Andreas
Deverse Richard A.
Fateley William G.
Geshwind Frank
Evans F. L.
Fulbright & Jaworski LLP
Plain Sight Systems, Inc.
LandOfFree
Devices and method for spectral measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Devices and method for spectral measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Devices and method for spectral measurements will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3794161