Device-under-test power management

Details Device-under-test power management Device-under-test power management

2008-06-12

2011-10-04

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750300

Reexamination Certificate

active

08030959

ABSTRACT:
One embodiment of the present invention includes a system for managing power to a plurality of devices-under-test (DUTs). The system comprises a DUT test system configured to perform at least one test associated with operation of the DUTs and to monitor current associated the at least one test of the plurality of DUTs. The DUT test system can communicate an instruction to a subset of the plurality of DUTs to cancel the at least one test if the monitored current is greater than a predetermined threshold. Each of the plurality of DUTs can comprise restart logic configured to restart the at least one test of the subset of the plurality of DUTs after being cancelled in response to the instruction.

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