Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Patent
1994-10-07
1998-03-10
Thomas, Tom
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
H01L 2900
Patent
active
057264821
ABSTRACT:
A device-under-test card includes a matrix of fuses and/or antifuses formed as part of a multi-layered structure. The matrix of fuses and/or antifuses can be electrically programmed to connect any one of first electrical contacts to any one of second electrical contacts and so allows the device-under-test card to act as a junction between burn-in board traces couplable to signal drivers and/or receivers and burn-in board traces couplable to terminals of a device-under-test. The device-under-test card also includes a discrete resistor or alternatively a resistor ladder that permits a terminal of a device-under-test to be coupled to a power or ground terminal or to any combination of resistances including a short, in addition or as an alternative to any one of various signal drivers and/or receivers.
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Thomas Tom
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