Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2006-05-17
2009-08-11
Booth, Richard A. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C438S455000
Reexamination Certificate
active
07572649
ABSTRACT:
A device transferring system includes a first substrate support portion on which to mount a first substrate, a second substrate support portion for supporting a second substrate opposed to the first substrate, a swinging unit for regulating the position of the first substrate support portion so that a device on the first substrate makes contact with the second substrate side in parallel to the second substrate, a movable stage for supporting and moving the swinging unit, a sensor unit for sensing the condition where the device on the first substrate has made contact with the second substrate side, the sensor unit being provided between the first substrate support portion and a sensor support portion formed in the swinging unit, and a measuring unit61for measuring the position of stop of a motion of the first substrate due to the contact of the first substrate with the second substrate, and for measuring the moving amount of the swinging unit after the approaching motion of the first substrate is stopped.
REFERENCES:
patent: 2005/0233504 (2005-10-01), Doi et al.
patent: 2004-273596 (2004-09-01), None
patent: 2004-281630 (2004-10-01), None
Doi Masato
Kanemitsu Toshiaki
Nishi Yuji
Tomoda Katsuhiro
Booth Richard A.
K&L Gates LLP
Sony Corporation
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