Device transfer mechanism for a test handler

Details Device transfer mechanism for a test handler Device transfer mechanism for a test handler

2005-11-22

2005-11-22

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010, C414S223010

Reexamination Certificate

active

06967475

ABSTRACT:
The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an onloading position to an offloading position along a predetermined path. A transfer arm with a plurality of transfer heads connected to it is located adjacent the path. The transfer heads are configured to pick up and transfer semiconductor devices from the platform to a testing position for testing, and thereafter to transfer the semiconductor devices from the testing position to the platform for offloading.

REFERENCES:
patent: 5617945 (1997-04-01), Takahashi et al.
patent: 5789685 (1998-08-01), Fukumoto
patent: 5920192 (1999-07-01), Kiyokawa
patent: 5957305 (1999-09-01), Takahashi
patent: 6019564 (2000-02-01), Kiyokawa et al.
patent: 6313654 (2001-11-01), Nansai et al.

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