Device testing using a holding-circuit

Details Device testing using a holding-circuit Device testing using a holding-circuit

2001-04-26

2004-08-10

Cuneo, Kamand (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06774658

ABSTRACT:

BACKGROUND
This invention relates to device testing using a holding-circuit.
When a new device is designed, it typically is tested to verify that the device conforms to design specifications. Testing is accomplished by applying input-signals to the device under test (DUT) and measuring the response-signals that result from the input-signals. In some testing environments, the input-signals are generated using a pulse-generating-source capable of producing pulse waveforms with pulse-widths in the nano-second range and rise-times in the pico-second range.
As the input-signals are applied to the DUT, measurements are taken at particular points on the DUT. To evaluate how the DUT responded to the input-signals, the response-signals and the input-signals are analyzed using standard measurement equipment. However, preserving input-signals for subsequent measurement purposes is difficult when the input-signals have narrow pulse-widths and fast rise-times.


REFERENCES:
patent: 3919568 (1975-11-01), Minner
patent: 4922184 (1990-05-01), Rosenstein et al.
patent: 5894424 (1999-04-01), Motohama et al.
patent: 6009541 (1999-12-01), Liu et al.
patent: 6282216 (2001-08-01), Ikeuchi et al.
patent: 6366109 (2002-04-01), Matsushita
patent: 6480016 (2002-11-01), Motoi et al.

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