Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2011-07-19
2011-07-19
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
Reexamination Certificate
active
07983866
ABSTRACT:
A device testing system includes a detecting module, a data determining module, an address processing module, and a data obtaining module. The detecting module detects if the device testing system has been successfully connected with a device to be tested. The data determining module determines if the device testing system includes test data required by the device to be tested. The address processing module determines if an address list includes an address of the device to be tested. The data obtaining module obtains test data required by devices to be tested whose addresses are included in the address list from the remote server. A test data obtaining method of the device testing system is also provided.
REFERENCES:
patent: 2006/0230083 (2006-10-01), Allyn et al.
patent: 1400832 (2003-03-01), None
Cheng Shu-Min
Chi Po-Jen
Hon Hai Precision Industry Co. Ltd.
Niranjan Frank R.
Raymond Edward
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