Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-09-10
2000-09-05
Metjahic, Safet
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3102
Patent
active
061148679
ABSTRACT:
The present invention relates to a device testing apparatus used for screening testing of semiconductor devices and the like, and having a constant temperature oven in which a through hole is formed passing from an outer wall to an inner wall, for maintaining an inner space at a constant temperature, and a test burn-in board on which a plurality of devices to be tested are mounted, provided inside the constant temperature oven. A first card has a plurality of first signal lines for inputting a signal to be supplied to the device to be tested, formed on a surface thereof, and there is provided a first male connector attached to one edge of the first card and connected to the plurality of first signal lines. Furthermore, there is provided a first female connector attached to one face of a mother board, for fitting into the first male connector, and a second female connector attached to the other face of the mother board opposite to the first female connector, and connected to the first female connector via a plurality of pins. Moreover, a second card inserted through the through hole of the constant temperature oven has a plurality of second signal lines connected to the device to be tested formed on a surface thereof, and there is provided a second male connector attached to one edge of the second card and connected to the second signal lines, and fitted into the second female connector.
REFERENCES:
patent: 4145620 (1979-03-01), Dice
patent: 5528161 (1996-06-01), Liken et al.
Ando Electric Co. Ltd.
Kobert Russell M.
Metjahic Safet
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