Device test apparatus and test method including control...

Details Device test apparatus and test method including control... Device test apparatus and test method including control...

2006-05-09

2006-05-09

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07042243

ABSTRACT:
One test board for executing a test is provided for each of a plurality of DUTs (Devices-Under-Test) such as semiconductor integrated circuits, a multi test board controller for managing these test boards is provided, and a plurality of test boards managed by each multi test board controller are operated in parallel to simultaneously perform independent tests on the respective DUTs.

REFERENCES:
patent: 6351834 (2002-02-01), Maekawa et al.
patent: 6779140 (2004-08-01), Krech et al.
patent: 64-47148 (1989-03-01), None

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