Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-10-26
2009-08-04
Lester, Evelyn A. (Department: 2873)
Image analysis
Applications
Manufacturing or product inspection
C382S141000, C382S149000, C382S218000, C382S286000, C382S307000, C250S559290, C250S559300, C348S086000, C348S092000, C348S095000, C359S663000
Reexamination Certificate
active
07570801
ABSTRACT:
A device comprises an imaging device, a placement element connected to the imaging device for placing a component on a substrate, as well as an optical system having an optical axis. The placement element and the imaging device can be jointly moved relative to the optical system to at least a position in which the optical axis is located between the imaging device and the placement element, wherein the position of a component supported by the placement element can be detected by means of the imaging device. The optical system is telecentric at least in an image space located near the imaging device as well as in an object space located near the placement element.
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Assembleon N.V.
Foley & Lardner LLP
Lester Evelyn A.
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