Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2007-10-09
2007-10-09
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
C356S073000, C382S154000, C073S602000, C250S559220, C250S22300B, C324S637000, C324S640000
Reexamination Certificate
active
11302220
ABSTRACT:
A device for measuring a distribution of selected properties of a material. The device includes an emitter configured to emit electromagnetic radiation at at least a first and second frequency in a selected frequency range through the material, at least one sensor configured to detect electromagnetic radiation transmitted through the material, and an analyzer configured to determine the distribution of selected properties based on the detected electromagnetic radiation at the at least first and second frequency. Further, the distribution of the selected properties is unchanged between the emitted electromagnetic radiation at the first and second frequencies.
REFERENCES:
patent: 4710700 (1987-12-01), Osaki et al.
patent: 4798209 (1989-01-01), Klingenbeck et al.
patent: 5115673 (1992-05-01), Kline et al.
patent: 5132623 (1992-07-01), De et al.
patent: 5588032 (1996-12-01), Johnson et al.
patent: 5924991 (1999-07-01), Hossack et al.
patent: 6026173 (2000-02-01), Svenson et al.
patent: 6042545 (2000-03-01), Hossack et al.
patent: 6112110 (2000-08-01), Wilk
patent: 6456093 (2002-09-01), Merkel et al.
patent: 6490471 (2002-12-01), Svenson et al.
patent: 6880387 (2005-04-01), Kessler et al.
patent: 7040168 (2006-05-01), Merkel
patent: WO-98/01069 (1998-01-01), None
Merkel Harald
Reimers Mikael
Birch & Stewart Kolasch & Birch, LLP
Merkel Physik
Mikael Reimers
Stock, Jr. Gordon J.
Toatley , Jr. Gregory J.
LandOfFree
Device, method and system for measuring the distribution of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device, method and system for measuring the distribution of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device, method and system for measuring the distribution of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3865408