Device including a contact detector

Details Device including a contact detector Device including a contact detector

2008-03-12

2011-11-15

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755110, C324S755070

Reexamination Certificate

active

08058886

ABSTRACT:
The present invention relates to a probe for determining an electrical property of an area of a surface of a test sample, the probe is intended to be in a specific orientation relative to the test sample. The probe may comprise a supporting body defining a first surface. A plurality of cantilever arms (12) may extend from the supporting body in co-planar relationship with the first surface. The plurality of cantilever arms (12) may extend substantially parallel to each other and each of the plurality of cantilever arms (12) may include an electrical conductive tip for contacting the area of the test sample by movement of the probe relative to the surface of the test sample into the specific orientation. The probe may further comprise a contact detector (14) extending from the supporting body arranged so as to contact the surface of the test sample prior to any one of the plurality of cantilever arms (12) contacting the surface of the test sample when performing the movement.

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patent: 2006284599 (2006-10-01), None
patent: WO 2005/124371 (2005-12-01), None
International Search Report on related PCT application (PCT/DK2008/000100) from International Searching Authority (EPO) dated Jun. 4, 2008.

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