Device for vibrating cantilever

Measuring and testing – Surface and cutting edge testing – Roughness

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Details

310357, 310359, G01B 734

Patent

active

060065958

ABSTRACT:
There is disclosed a device for applying vibrations to a cantilever used in an atomic force microscope. The cantilever has a base portion, and a probe is attached to the front end of the cantilever. The device has a piezoelectric plate subassembly consisting of first and second piezoelectric plates having junction faces cemented together. A piezoelectric plate subassembly support portion supports a part of the second piezoelectric plate. A voltage is applied to the piezoelectric plates so that one of them is stretched vertical to the junction faces and that the other is contracted vertical to the junction faces.

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patent: 5001681 (1991-03-01), Bertoldi et al.
patent: 5107114 (1992-04-01), Nishioka et al.
patent: 5818150 (1998-10-01), Yamamoto et al.
"Atomic force microscope-force mapping and profiling on a sub 100-.ANG. scale", Y. Martin, C.C. Williams and H.K. Wickramasinghe, J. Appl. Phys., 61 (10), May 15, 1987 (pp. 4723-4729).

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