Device for translating a test sequence to a burn-in sequence for

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371 20, 324 73R, G01R 3128

Patent

active

046897917

ABSTRACT:
In order to translate a test sequence into a sequence for burn-in operation of integrated logic circuits and digital circuits, the invention provides a method and a device for automatic translation of a test truth-table into a burn-in truth-table. In addition to the reduction in cost achieved by automatic generation of test sequence, a test performed after burn-in operation of a circuit permits reliable detection of a circuit fault since the same type of sequence is adopted both for burn-in and for testing.

REFERENCES:
patent: 4379259 (1983-04-01), Varadi
patent: 4388719 (1983-06-01), Soltysik
patent: 4495622 (1985-01-01), Charruau

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