Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2008-10-17
2010-12-14
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C433S029000, C433S215000
Reexamination Certificate
active
07852492
ABSTRACT:
A device for tomographic scanning objects comprises a source of light for irradiating the object; a first grid arranged in the optical axis of the light beam so that a pattern of the first grid is projected on the object; an optical imaging assembly for imaging the object on a sensor; and a second grid provided in the optical axis of the reflected light beam having a pattern matching the first grid, through said second grid the reflected light beam having the pattern of the first grid being guided so that the sensor senses the light beam reflected by the object with a Moiré pattern resulting from overlying the pattern of the first grid and the pattern of the second grid. The device further comprises a means for moving the first grid and/or the second grid at a frequency causing fluctuations in the intensity of the resulting Moiré pattern.
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Maginot Moore & Beck LLP
Nectar Imaging S.R.L.
Pham Hoa Q
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