Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2011-06-14
2011-06-14
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07962304
ABSTRACT:
An apparatus including a test circuit, an output circuit and a control circuit. The test circuit may be configured to generate test data in response to one or more test vectors. The output circuit may be configured to present data in a first mode and prevent presentation of data in a second mode. The output circuit may be configured to switch between the first mode and the second mode in response to a control signal. The control circuit may be configured to generate the control signal according to predetermined criteria for protecting secure data within the apparatus while allowing the test data to be presented.
REFERENCES:
patent: 5357572 (1994-10-01), Bianco et al.
patent: 7757084 (2010-07-01), Walmsley et al.
patent: 2005/0066189 (2005-03-01), Moss et al.
Howard Michael A.
Pearson Eric C.
Christopher P. Maiorana PC
LSI Corporation
Raymond Edward
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