Device for the laterally resolved investigation of a laterally h

Optics: measuring and testing – Of light reflection

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G01B 1106, G01N 2184

Patent

active

054424488

ABSTRACT:
A device for the laterally resolved investigation of a laterally heterogeneous ultrathin object layer, especially for the laterally resolved detection of a change in the layer thickness of the object layer which results from a specific binding reaction of a first binding partner bound to the object layer with an unbound second binding partner. The device has a multilayer structure which extends in an investigation region and includes the object layer as first layer and a second layer adjacent to the latter, a coupler arrangement for the coupling in of excitation light into the second layer. The excitation light generates at at least one defined angle of incidence in the second layer a bound, non-radiating electromagnetic wave, from which an evanescent wave extends into the object layer. An optical imaging system is provided for the imaging of the investigation region of the object layer in an image plane at a defined angle of emergence, at which detection light is coupled out from the second layer. The coupler arrangement includes an optical grating structure which extends in the investigation region parallel to the object layer and which is rotatable about an axis extending perpendicular to the grating plane. This allows adjustment of the image contrast, by varying the orientation of the grating lines relative to the plane of incidence.

REFERENCES:
patent: 4889427 (1989-12-01), Van Veen et al.
patent: 4915482 (1990-04-01), Collins et al.
Rothenhausler et al "Surface-plasmon microscopy" Nature, No. 6165, vol. 332, 14 Apr. 1988, pp. 615-617.
Pockrand et al, "Surface plasma oscillations at sinusoidal silver surfaces" Applied Optics, vol. 16, No. 7, Jul. 1977, pp. 1784-1786.
Teng, "Plasma Radiation From Metal Grating Surfaces", Physical Review Letters, vol. 19, No. 9, Aug. 28, 1967, pp. 511-514.
Hickel et al, J. Appl. Phys., "Surface plasmon microscopic characterization of external surfaces", vol. 66, (10), Nov. 15, 1987_9, pp. 4832-4836.
Hickel et al, J. Appl. Phys., "Surface plasmon optical characterization of lipid monolayers at 5 .mu.m lateral resolution", vol. 67, (8), Apr. 15, 1990, pp. 3572-3757.
Knoll, Materials Research Society MRS Bulletin, "Optical Characterization of Organic Thin Films and Interfaces with Evanescent Waves", vol. 16, No. 7, Jul. 1991, pp. 29-39.
Inagaki et al, The American Physical Society, "Photoacoustic study of plasmon resonance absorption in a diffraction grating", (1983).
Bryan-Brown et al, Journal of Modern Optics, "Polarisation conversion through the excitation of surface plasmons on a metallic grating", 1990, vol. 37, No. 7, pp. 1227-1232.

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