Device for the functional testing of integrated circuits and a m

Details Device for the functional testing of integrated circuits and a m Device for the functional testing of integrated circuits and a m

1988-09-27

1989-09-19

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158P, 324158F, G01R 104, G01R 1073

Patent

active

048684937

ABSTRACT:
The invention relates to a device for the functional testing of integrated circuits, in which the integrated circuit to be tested can be connected via adapters to computer-controlled test heads. In order to make the testing device more flexible and increase its efficiency, a test piece (i.e., integrated circuit) with a large number of external terminals can be connected via a special adapter to at least two test heads placed side by side and can be tested by them in common and/or two or more test pieces with a smaller number of terminals can be connected via a second special adapter to a single test head and be tested in common. The invention further relates to associated operating methods.

REFERENCES:
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patent: 3842346 (1974-10-01), Bobbitt
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patent: 4393437 (1983-07-01), Bell et al.
patent: 4402055 (1983-08-01), Lloyd et al.
patent: 4411719 (1983-10-01), Lindberg
patent: 4497056 (1985-01-01), Sugamori
"Mass Termination Test Probe Fixture", by Reib et al., IBM Tech. Disc. Bull., vol. 21 #2, 7/78, pp. 765-766.
"Module Thermal Test Chamber", by Kilburn et al., IBM Tech. Disc. Bull., vol. 24, #9, 282, pp. 4650-4651.
Fairchild Product Description, "Series 10 Production LSI Test System", Fairchild Corporation, May 1981, No. 57148901.

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