Device for the EMI testing of electronic systems

Details Device for the EMI testing of electronic systems Device for the EMI testing of electronic systems

1987-05-11

1989-06-06

Sikes, William L.

Communications: radio wave antennas

Antennas

Measuring signal energy

H01Q 1700, G01R 3100

Patent

active

048375810

ABSTRACT:
The device according to the invention exhibits a TEM waveguide (1), which opens out in a pyramid shape and which is closed by a wall (7) of high-frequency peak absorbers (7.1) and which exhibits an asymmetrically disposed, plate-shaped inner line (6), which is connected to a plurality of terminal resistors (8.1, 8.2, 8.3) through the absorber wall (7). The TEM waveguide (1) further exhibits a closed outer line (5). The absorber wall (7) is curved in the manner of a spherical segment, the center of curvature being situated in the region of the tip (2) of the pyramid-shaped TEM waveguide (1).

REFERENCES:
patent: 3806943 (1974-04-01), Holloway
patent: 4546358 (1985-10-01), Edlin et al.
The Exciting Mechanism of the Parallel Plate EMP Simulator, Shen et al., IEEE Transactions on Electromagnetic Compatability, vol. EMC-29, No. 1, Feb. 1987.
IEEE Transaction on Instrumentation & Measurement, M. L. Crawford et al., Sep., 1977, vol. IM-26, No. 3, pp. 225-230.
"Antenna Measurements-1978", W. Kummer, et al., Proceedings of the IEEE, vol. 66, No. 4, Apr. 1978, pp. 483-507.
Der NEMP-Modell-Simulator des INT Euskirchen, H. U. Schmidt, Jan. 1985.
A Review of Electromagnetic Compatibility/Interference Measurement Methodologies, M. T. Ma, et al., Proceedings of the IEEE, Mar. 1985, No. 3.

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