Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2006-02-28
2006-02-28
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
Reexamination Certificate
active
07006216
ABSTRACT:
A device for the chemical analysis of solid or molten material samples, based on laser-induced emission spectroscopy, including a laser source generating a laser beam, a deflection device deflecting the laser beam, a focusing device focusing the laser beam, a device that guides the reflections of a plasma ignited by the laser beam on the material sample to an evaluation device. To arrange the laser source and the evaluation device remotely from the material sample, an arm having at least one movable joint and a cavity for the laser beam is provided between the laser source and the material sample for guiding the laser beam. The deflection device is shaped as a mirror or a prism and is provided at the articulation of the arm, whereby the laser source and the evaluation device are arranged to be independent of the material sample in terms of their movements.
REFERENCES:
patent: 4563567 (1986-01-01), Geffroy et al.
patent: 4645342 (1987-02-01), Tanimoto et al.
patent: 4698483 (1987-10-01), Marinoni et al.
patent: 4818106 (1989-04-01), Koch et al.
patent: 4892992 (1990-01-01), Akeel et al.
patent: 4986658 (1991-01-01), Kim
patent: 4995723 (1991-02-01), Carlhoff et al.
patent: 3413589 (1985-10-01), None
patent: 0 362 577 (1990-04-01), None
patent: 5-40092 (1993-02-01), None
patent: 5-40094 (1993-02-01), None
patent: 11-326206 (1999-11-01), None
patent: WO 97/22859 (1997-06-01), None
patent: WO 99/49301 (1999-09-01), None
A. Knight et al., “Characterization of Laser-Induced Breakdown Spectroscopy (LIBS) for Application to Space Exploration”,2000 Society for Applied Spectroscopy, vol. 54, No. 3, 2000, pp. 331-340.
Bauerle Dieter
Gruber Johann
Heitz Johannes
Ramaseder Norbert
Dickstein , Shapiro, Morin & Oshinsky, LLP
Evans F. L.
Voest-Alpine Industrieanlagenbau GmbH & Co.
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