Device for the chemical analysis of material samples and...

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07006216

ABSTRACT:
A device for the chemical analysis of solid or molten material samples, based on laser-induced emission spectroscopy, including a laser source generating a laser beam, a deflection device deflecting the laser beam, a focusing device focusing the laser beam, a device that guides the reflections of a plasma ignited by the laser beam on the material sample to an evaluation device. To arrange the laser source and the evaluation device remotely from the material sample, an arm having at least one movable joint and a cavity for the laser beam is provided between the laser source and the material sample for guiding the laser beam. The deflection device is shaped as a mirror or a prism and is provided at the articulation of the arm, whereby the laser source and the evaluation device are arranged to be independent of the material sample in terms of their movements.

REFERENCES:
patent: 4563567 (1986-01-01), Geffroy et al.
patent: 4645342 (1987-02-01), Tanimoto et al.
patent: 4698483 (1987-10-01), Marinoni et al.
patent: 4818106 (1989-04-01), Koch et al.
patent: 4892992 (1990-01-01), Akeel et al.
patent: 4986658 (1991-01-01), Kim
patent: 4995723 (1991-02-01), Carlhoff et al.
patent: 3413589 (1985-10-01), None
patent: 0 362 577 (1990-04-01), None
patent: 5-40092 (1993-02-01), None
patent: 5-40094 (1993-02-01), None
patent: 11-326206 (1999-11-01), None
patent: WO 97/22859 (1997-06-01), None
patent: WO 99/49301 (1999-09-01), None
A. Knight et al., “Characterization of Laser-Induced Breakdown Spectroscopy (LIBS) for Application to Space Exploration”,2000 Society for Applied Spectroscopy, vol. 54, No. 3, 2000, pp. 331-340.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Device for the chemical analysis of material samples and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device for the chemical analysis of material samples and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for the chemical analysis of material samples and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3708105

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.