Optics: measuring and testing – Lamp beam direction or pattern
Patent
1998-03-05
1999-06-01
Pham, Hoa Q.
Optics: measuring and testing
Lamp beam direction or pattern
G01J 100
Patent
active
059092742
ABSTRACT:
Device for the characterization of a laser beam according to a "Knife edge" method as defined by Standard ISO 11146. The device has a lens for the focalization of an incident laser beam, and a detector. Interception elements are located between said lens and said detector in order to intercept sequentially the focalized laser beam in a plurality of different positions along its axis of propagation. The interception elements are suitable to allow, in each one of said positions, the passage of a progressively increasing (or decreasing) portion of the vocalized laser beam starting from a condition of substantially total (or null) interception up to a condition of substantially null (or total) interception.
REFERENCES:
patent: 3612885 (1971-10-01), Arnaud
patent: 5064284 (1991-11-01), Johnston, Jr. et al.
patent: 5078491 (1992-01-01), Johnston, Jr.
patent: 5100231 (1992-03-01), Sasnett et al.
patent: 5214485 (1993-05-01), Sasnett et al.
patent: 5267012 (1993-11-01), Sasnett et al.
patent: 5459565 (1995-10-01), Aharon
Patent Abstracts of Japan, vol. 11, No. 201, Jun. 30, 1987.
Cise S.p.A.
Laser Point s.r.l.
Pham Hoa Q.
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