Device for testing semiconductor devices

Details Device for testing semiconductor devices Device for testing semiconductor devices

1992-05-22

1994-06-21

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 1073

Patent

active

053231066

ABSTRACT:
A device for testing semiconductor devices includes a group of probes arranged to correspond to at least a row of electrode terminals which are formed on each of the semiconductor devices, a printed plate having an opening in which the semiconductor device is positioned and a conductive pattern, four guide members made of insulating material and having a face on which a plurality of grooves are formed to hole and arrange the probes at the same pitch as that of the electrode terminals, and a positioning member and an upper guide which position the guide members relative to the semiconductor device and the printed plate to electrically and detachably contact the probes with the electrode terminals and the conductive lines along the rim of the opening of the printed plate.

REFERENCES:
patent: 5066907 (1991-11-01), Tarzwell et al.

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