Device for testing semiconductor devices

Details Device for testing semiconductor devices Device for testing semiconductor devices

1985-05-06

1987-03-17

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 25, G01R 1512, G01R 3122, G01R 3128

Patent

active

046510885

ABSTRACT:
A semiconductor device testing device for conducting a logical verification and an electric characteristics measurement of a semiconductor device, includes a measuring circuit provided corresponding to each pin of the semiconductor device to be tested, the measuring circuit including a comparator intended to compare the output voltage or current from the semiconductor device with a referent voltage or current; a memory for storing information required for the logical verification and the electric characteristics measurement; a controller for controlling the execution of the logical verification and the electric characteristics measurement including an application of a reference voltage or current to the comparator; and a judging circuit to determine whether the result of the logical verification or the electric characteristics measurement is normal or abnormal from the output of the comparator.

REFERENCES:
patent: 3976940 (1976-08-01), Chau et al.
patent: 4055801 (1977-10-01), Pike et al.
patent: 4092589 (1978-05-01), Chau et al.
patent: 4312067 (1982-01-01), Shirasaka
patent: 4500836 (1985-02-01), Staudacher
patent: 4519076 (1985-05-01), Priel et al.
"Programmable Current Load" from Sentry 50 Product Description catalog of Fairchild, Apr. 1983.

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