Device for testing multiple pulling resistor connections using a

Details Device for testing multiple pulling resistor connections using a Device for testing multiple pulling resistor connections using a

1994-12-20

1997-10-21

Beausoliel, Jr., Robert W.

Excavating

G01R 3100

Patent

active

056804075

ABSTRACT:
A device which comprises an electronic circuit and at least two connections, each of which is connected to a separate output of the circuit and to a separate pulling resistor. The test resistor is connected between a fixed supply voltage and a test point with the pulling resistors connected to the test point and the electronic circuit arranged to test the connections by application of test data to the connections so that a given response is formed on the test point.

REFERENCES:
patent: 4651084 (1987-03-01), Welsh et al.
patent: 4791358 (1988-12-01), Sauerwald et al.
patent: 4879717 (1989-11-01), Sauerwald et al.
patent: 5172377 (1992-12-01), Robinson et al.
patent: 5285119 (1994-02-01), Takahashi
patent: 5366906 (1994-11-01), Wojnarowski
patent: 5379302 (1995-01-01), Andrews
patent: 5450415 (1995-09-01), Kamada
IEEE Std. 1149.1-1990. "IEEE Standard Test Access Port and Boundary-Scan Architecture".
H. Bleeker et al., "Boundary-Scan Test, A Practical Approach", Kluwer Academic Publishers, Boston, US, 1993 ISBN 0-7923-9296, pp. 1-17.

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