Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-12
2006-09-12
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C714S724000
Reexamination Certificate
active
07107166
ABSTRACT:
LSI test equipment can acquire output data of an LSI as a device under test by a clock signal output from the LSI to be measured and acquire measurement data synchronously with the output data having jitter. The LSI test equipment includes a clock side time interpolator for acquiring the clock output from the LSI to be measured by a plurality of strobes having a predetermined timing interval and outputting it as encoded level data of time series, a data side time interpolator for acquiring the output data from the LSI to be measured by a plurality of strobes having a predetermined timing interval and outputting it as level data of time series, and a selector for receiving the level data from both of the time interpolators, selecting output data at the clock edge timing, and outputting it as data to be measured.
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Advantest Corp.
Assouad Patrick
Charioui Mohamed
Muramatsu & Associates
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