Device for testing an analog-to-digital converter

Coded data generation or conversion – Converter calibration or testing

Reexamination Certificate

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C341S143000, C341S155000

Reexamination Certificate

active

07443322

ABSTRACT:
A device for testing an analog-to-digital converter providing a digital signal at a given sampling frequency, comprising a unit for providing a test signal to the converter, the test signal being a periodic signal comprising frequency components only at a fundamental frequency and at harmonics of the fundamental frequency, the fundamental frequency being a multiple of one quarter of the sampling frequency; a filter capable of receiving the digital signal and of rejecting the fundamental frequency to provide a filtered digital signal; and a unit capable of receiving the digital signal and the filtered digital signal and of providing a signal representative of the ratio between the effective powers of the digital signal and of the filtered digital signal.

REFERENCES:
patent: 5068657 (1991-11-01), Tsai
patent: 6333706 (2001-12-01), Cummings et al.
patent: 6339389 (2002-01-01), Zade
patent: 6498998 (2002-12-01), Furukawa
patent: 6580380 (2003-06-01), Oh et al.
patent: 61138173 (1986-06-01), None
Huang et al., “Analog Signal Generator For BIST Of Wideband IF Signals Bandpass Sigma—Delta Modulator”, Microelectronics Journal 34 (2003) pp. 85-91.
R.A. Belcher, “Multi-Tone Testing Of Quantiserss Using PRBS Signals”, Computer Standards & Interfaces 22 (2000) pp. 269-279.
Roy et al, “High Accuracy Stimulus Generation For A/D Converter BIST”, ITC International Test Conference, pp. 1031-1038.
International Search Report dated Feb. 2, 2006.

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