Excavating
Patent
1981-07-13
1984-03-06
Atkinson, Charles E.
Excavating
324 73R, 371 27, G01R 3128
Patent
active
044358067
ABSTRACT:
A device for processing digital signals includes combinatorial and sequential logic elements. For the testing of the device, a shift register can be formed from the sequential elements. A test pattern is applied thereto. The result of the processing of the test pattern is applied to the shift register. The output of the shift register is connected to a second shift register which forms a moving multibit sum pattern from a received series of result patterns by way of a feedback circuit to at least one Exclusive-OR-element. An output of the feedback circuit is connected to an input of the first shift register in order to apply a subsequent test pattern thereto. After completion of the test, the sum pattern formed is checked.
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patent: 3761695 (1973-09-01), Eichelberger
patent: 3924181 (1975-12-01), Alderson
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H. J. Nadig, Testing a Microprocessor Product Using a Signature Analysis, 1978 Semiconductor Test Conference, Cherry Hill, N.J., Oct.-Nov. 1978, pp. 159-169.
Kuiper Krijn
Niessen Cornelis
Segers Marinus T. M.
Atkinson Charles E.
Cannon, Jr. James J.
U.S. Philips Corporation
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