Device for subsurface flaw detection in reflective materials by

Details Device for subsurface flaw detection in reflective materials by Device for subsurface flaw detection in reflective materials by

1989-09-11

1991-02-26

Fields, Carolyn E.

Radiant energy

Infrared-to-visible imaging

250342, 2503591, 374 5, G01N 2572

Patent

active

049964267

ABSTRACT:
Apparatus for nondestructive detection of subsurface defects in a continuously moving workpiece of sheet material by using an infrared thermal imager. The temperature of a portion of the surface of sheet material is altered and the presence of subsurface flaws is indicated by development of discontinuities in the surface temperature distribution above the defects. In order to avoid problems due to changes in the infrared emissivity of the surface of sheet material, such as caused by grease patches or oxidized areas as well as errors caused by reflections of other sources of infrared radiation from the surface, the thermal image of the portion is first transferred by contact to a surface of a thermal transfer device whose surface has a high infrared emissivity and a low infrared reflectivity. Then the thermal image of the portion is obtained from the surface of the thermal transfer device.

REFERENCES:
patent: 3020745 (1962-02-01), Sielicki
patent: 3378685 (1968-04-01), Green et al.
patent: 3427861 (1968-07-01), Maley
patent: 3462602 (1969-08-01), Apple
patent: 3504524 (1970-04-01), Maley
patent: 4215562 (1980-08-01), Gavrilin et al.
patent: 4480168 (1984-09-01), Cielo et al.
Cielo et al., "Thermographic Nondestructive Evaluation of Industrial materials and Structures", Materials Evaluation, Apr. 1987, vol. 45, 61, pp. 452 to 460.
Green, "Thermal and Infrared Nondestructive Testing of Composites and Ceramics", Materials Evaluation, 29 (11), Nov. 1971, pp. 241-248.
Maldague et al., "Subsurface Flaw Detection in Reflective Materials by Thermal-Transfer Imaging", Proceedings of the SPIE--The International Society for Optical Engineering, Mar. 1989, vol. 1094, pp. 163 to 173.

Affiliated with

Also associated with

Rating

Device for subsurface flaw detection in reflective materials by does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device for subsurface flaw detection in reflective materials by , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for subsurface flaw detection in reflective materials by will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-295316