Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2006-02-14
2009-11-24
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
Reexamination Certificate
active
07623231
ABSTRACT:
A device for Raman spectroscopy comprises a fine structure body provided with an array structure region, in which a plurality of recess areas having approximately identical shapes, as viewed from above, are arrayed regularly at approximately identical pitches. A surface of the fine structure body on the side of the array structure region acts as a light scattering surface. The fine structure body may be constituted of an un-anodized part of a metal body to be subjected to anodic oxidation processing, the un-anodized part remaining after a processing, wherein the anodic oxidation processing is performed on the metal body, a part of the metal body being thereby converted into a metal oxide layer, and wherein the metal oxide layer is removed from the metal body, has been performed.
REFERENCES:
patent: 5376556 (1994-12-01), Tarcha et al.
patent: 6739930 (2004-05-01), Cheng et al.
patent: 2005/0105085 (2005-05-01), Naya
patent: 2004-170334 (2004-06-01), None
FUJIFILM Corporation
Nur Abdullahi
Sughrue & Mion, PLLC
Toatley Jr. Gregory J
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