Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Patent
1978-09-22
1981-03-10
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
324115, 324132, 324225, G01B 706, G01R 1510, G01R 1508
Patent
active
042557097
ABSTRACT:
A device for measuring the thickness of coatings, wherein a thickness gauge is electrically coupled to a circuit intended to convert the electric signal at the output of said thickness gauge into an electric signal proportional to the thickness of the coating. The conversion circuit comprises a peak detector whose output is electrically coupled to inputs of an automatic measurement range switching unit and a subtractor. Another input of the automatic measurement range switching unit is connected to an output of a reference voltage forming unit, its one output is electrically coupled to another input of the subtractor, another output is connected to an input of an adder, whereas a third output is electrically coupled to an input of a measuring sensitivity control unit. An output of the subtractor is connected to another input of the measuring sensitivity control unit whose output is connected to another input of the adder. The output of the adder serves as the output of the conversion circuit and is connected to recorder.
REFERENCES:
patent: 3536998 (1970-10-01), Nordholm
patent: 3549998 (1970-12-01), Fluegel
patent: 3636338 (1972-01-01), Abnett et al.
patent: 4122529 (1978-10-01), Hoech
Markus, Source Book of Electronic Circuits, pub. in 1968 by McGraw-Hill, Inc., pp. 362-363.
Gruenberg, "Hand Book of Telemetry and Remote Control" pub. in 1967 by McGraw-Hill, Inc., pp. 3-23.
"Instruments for Non-Destructive Inspection Developed at the Institute of Introscopy", Zavodshaya Laboratoria, No. 6, vol. 40, 1974.
Rluyeva et al., "Electromagnetic Instrument MIP-10 for Measuring Thickness of Non-Ferromagnetic Coatings on Ferromagnetic Base", Defectoscopia No. 6, 1971, pp. 118-119.
Darofeev et al., "Thickness Measurement of Coatings by Means of Eddy Currents," STS Priborprom, Public Institute 1975, pp. 43-45.
Aniskovich Valery M.
Kaloshin Valentin A.
Malko Ivan I.
Naumenko Nikolai N.
Perfiliev Vladimir V.
Snow Walter E.
Strecker Gerard R.
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