Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2011-08-23
2011-08-23
Bryant, Kiesha R (Department: 2893)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C257SE21529
Reexamination Certificate
active
08003411
ABSTRACT:
Provided is a substrate processing apparatus and a method of manufacturing a semiconductor device, which are hard to cause a defect in processing a substrate owing to that a pressure inside a process chamber is not kept constant, and which enable a better processing of a substrate.
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Oct. 30, 2009 Notice of Allowance issued in U.S. Appl. No. 12/225,118.
Kimura Kazuhiro
Megawa Yasuhiro
Yuasa Kazuhiro
Bryant Kiesha R
Harrison Monica D
Hitachi Kokusai Electric Inc.
Oliff & Berridg,e PLC
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