Device for optimizing fabrics based on measured thread data...

Details Device for optimizing fabrics based on measured thread data... Device for optimizing fabrics based on measured thread data...

2005-08-09

2005-08-09

Picard, Leo (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S143000, C356S238200, C356S430000

Reexamination Certificate

active

06928335

ABSTRACT:
An apparatus for optimizing actual woven fabrics on the basis of measured yarn data has at least one measuring device for measuring the yarn diameter, a structure input device for inputting and freely changing definable structures, a device for controlling the measuring device and for evaluation, and a display device. The actual fabric being computed and represented on the basis of the measured yarn diameters and the freely definable structure and the fact that the defined structure of the fabric can be changed making it possible to adapt and optimize the actual fabric to the measured individual yarn diameters.

REFERENCES:
patent: 4803531 (1989-02-01), Riley et al.
patent: 4887155 (1989-12-01), Massen
patent: 5016183 (1991-05-01), Shyong
patent: 5671061 (1997-09-01), Hoeller
patent: 6130746 (2000-10-01), Nevel et al.

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