Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2004-10-06
2008-07-01
Gutierrez, Diego (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S713000, C323S224000, C361S101000
Reexamination Certificate
active
07394264
ABSTRACT:
The invention relates to a device for measuring current in an inductor and being connected in parallel with said inductor. The device includes a network in parallel with the inductor and connected to the terminals A and B comprising a resistor R2in series with a resistor R1in parallel with a capacitor C1; a voltage offset circuit having a DC voltage generator E connected in parallel with an offset resistor (Roffset) in series with two parallel resistors R3and R4, the positive pole of the voltage source being connected to terminal B of the inductor; a temperature compensation circuit comprising a current source controlled as a function of the temperature, one of the two terminals of the current source being connected to the negative pole of the generator E, the other terminal of the current source being connected to different points of the measurement device.
REFERENCES:
patent: 4910455 (1990-03-01), Nadd
patent: 5501517 (1996-03-01), Kiuchi
patent: 6222356 (2001-04-01), Taghizadeh-Kaschani
patent: 6275016 (2001-08-01), Ivanov
patent: 6377034 (2002-04-01), Ivanov
patent: 6469481 (2002-10-01), Tateishi
patent: 2003/0071636 (2003-04-01), Liebler
patent: 2005/0179423 (2005-08-01), Xing
patent: 2007/0241727 (2007-10-01), Luo et al.
Blanc Flavien
Taurand Christophe
Baldridge Benjamin M
Gutierrez Diego
Lowe Hauptman & Ham & Berner, LLP
Thales
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