Device for non-destructive measurement of a surface layer of a m

Details Device for non-destructive measurement of a surface layer of a m Device for non-destructive measurement of a surface layer of a m

1971-06-03

1977-08-02

Gill, James J.

Measuring and testing

Liquid analysis or analysis of the suspension of solids in a...

Content or effect of a constituent of a liquid mixture

73 715US, G01N 2900

Patent

active

040388654

ABSTRACT:
This invention relates to a device for non-destructive measurement of the extent to which a surface layer of a material has been affected by a superficial treatment. The device has an emitter of ultrasonic waves and a receiver therefor, the emitter and receiver being movable over the arcuate surface of a semi-cylindrical block which is applied to the material being studied. The emitter and receiver can be moved until the ultrasonic beam is reflected by the surface of the material and measured, means being provided for precise measurement of the angle formed between the emitter and receiver.

REFERENCES:
patent: 2819613 (1958-01-01), Neiley
patent: 2992553 (1961-07-01), Joy
"Critical Ultrasonic Reflectivity-A Neglected Tool for Material Evaluation" by Rollins from Materials Evaluation, Dec. '66 pp. 683-689.

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