Device for measuring thermal properties of a test substance-the

Details Device for measuring thermal properties of a test substance-the Device for measuring thermal properties of a test substance-the

1989-12-06

1991-09-03

Will, Thomas B.

Thermal measuring and testing

Determination of inherent thermal property

Thermal conductivity

347 43, G01N 2518

Patent

active

050447670

ABSTRACT:
A device for measuring thermal properties of a test substance, which device incorporates a thin element or a layer of an electrically conductive material, e.g. metal, intended to be brought in heat conductive contact with said test substance (3), means for passing an electric current through said element or layer for supplying heat to the test substance and causing a temperature increase therein and instrument for recording the voltage variation over the element or layer as a function of time. In order to increase the characteristic time for the experiments and thereby making it possible to use less sophisticated measuring instruments the active part of said element (6) or layer (4) over which the measurement is made has substantially equal size along at least two lateral dimensions. The element can e.g. be given of square or circular shape.

REFERENCES:
patent: 4630938 (1986-12-01), Piorkowska-Palczewska et al.
patent: 4841543 (1989-06-01), Dittmar et al.
patent: 4859078 (1989-08-01), Bowman et al.
patent: 4861167 (1989-08-01), Lobo et al.
Gustafsson et al., Journal of Applied Physics 52, Apr. 1981, pp. 2596-2600.
Gustafsson et al., Journal of Physic. D: Applied Physics, vol. 12, 1979, pp. 1411-1421.
Proceedings of 5th Annual ISA Test Measurement Symposium: Advances in Test Measurement, 1968, Hager Jr., pp. 1-6.

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