Device for measuring the thickness of thin metallic layers depos

Details Device for measuring the thickness of thin metallic layers depos Device for measuring the thickness of thin metallic layers depos

1985-10-24

1988-06-21

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324207, 324227, 324233, G01B 710, G01B 714, G01R 3312

Patent

active

047527390

ABSTRACT:
A method and apparatus for measuring the thickness of thin metallic layers deposited on a conductive support, wherein the thickness is determined from the measurement of the losses corresponding to the Joule effect, due to the eddy currents which appear when a magnetic circuit excited by an alternating voltage is brought close to the metallic surface.

REFERENCES:
patent: 2116119 (1938-05-01), Loewenstein
patent: 2764734 (1956-09-01), Yates
patent: 3229198 (1966-01-01), Libby
patent: 3358225 (1967-12-01), Peugeot
patent: 3535625 (1970-10-01), Pratt
patent: 3626344 (1971-12-01), Shaternikov et al.
patent: 3878457 (1975-04-01), Rodgers
patent: 3986105 (1976-10-01), Nix et al.
patent: 4652823 (1987-03-01), Sutton

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