Device for measuring the thickness of layers with a radionuclide

Details Device for measuring the thickness of layers with a radionuclide Device for measuring the thickness of layers with a radionuclide

1976-05-28

1978-05-09

Morrison, Malcolm A.

Boots, shoes, and leggings

250272, 250308, 364563, 364571, G06F 1520, G01N 2320

Patent

active

040890546

ABSTRACT:
A normalized count from a digital computer in a layer-thickness measuring device of the beta ray back-scatter type, is fed to a digital-analog converter and a correction circuit which realizes the function X.sub.n corr = X.sub.n +A a.sub.2 X.sub.n.sup.p (1-x.sub.n).sup.q and then to an indicator having a non-linear scale, in which X.sub.n is the normalized count, A is a dimensionless number between +1 and -1, a.sub.2 is a dimensionless number between +0.1 and -0.1, and p and q are dimensionless positive values around unity but different from one another which are permanently wired into the correction circuit.

REFERENCES:
patent: 3405267 (1968-10-01), Chope
patent: 3588507 (1971-06-01), Weinstock
patent: 3639763 (1972-02-01), Streng
patent: 3665199 (1972-05-01), Cahill et al.
patent: 3854042 (1974-12-01), Ott
patent: 4009376 (1977-02-01), Faraguet

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